Characterization of indium-tin oxide interfaces using X-ray photoelectron spectroscopy and redox processes of a chemisorbed probe molecule: Effect of surface pretreatment conditions

Langmuir

Volumn 18, Issue 2, 2002, Pages 450-457

  Donley, Carrie ^a   Dunphy, Darren ^a,b   Paine, David ^c   Carter, Chet ^a   Nebesny, Ken ^a   Lee, Paul ^a   Alloway, Dana ^a   Armstrong, Neal R ^a  

^a University of Arizona   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c BROWN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CHEMISORPTION; ELECTRON TRANSITIONS; ETCHING; HYDROLYSIS; INTERFACES (MATERIALS); REDOX REACTIONS; STOICHIOMETRY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

INDIUM-TIN OXIDE (ITO) THIN FILMS;

INDIUM COMPOUNDS;

EID: 0037154486     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la011101t     Document Type: Article

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