Failure modes in polymer-based light-emitting diodes

Synthetic Metals

Volumn 95, Issue 2, 1998, Pages 79-85

  Sheats, James R ^a   Roitman, Daniel B ^a  

^a HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

Failure modes; Light emitting diodes

Indexed keywords

DEFECTS; DEGRADATION; FAILURE ANALYSIS; LEAKAGE CURRENTS; LUMINESCENT DEVICES; OXIDATION; PHOTOCHEMICAL REACTIONS; SEMICONDUCTING FILMS; SEMICONDUCTING POLYMERS; SHORT CIRCUIT CURRENTS;

PHOTOOXIDATION;

LIGHT EMITTING DIODES;

EID: 0032083454     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(98)00031-9     Document Type: Review

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