Characterization of treated indium-tin-oxide surfaces used in electroluminescent devices

Journal of Applied Physics

Volumn 86, Issue 3, 1999, Pages 1688-1692

  Mason, M G ^a   Hung, L S ^a   Tang, C W ^a   Lee, S T ^b   Wong, K W ^b   Wang, M ^b  

^a EASTMAN KODAK COMPANY   (United States)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODES; ELECTROLUMINESCENCE; ELECTRONIC DENSITY OF STATES; FERMI LEVEL; GLOW DISCHARGES; INDIUM COMPOUNDS; OXIDATION; OZONE; REDUCTION; ULTRAVIOLET RADIATION;

HOLE INJECTION ELECTRODE; INDIUM TIN OXIDE;

LUMINESCENT DEVICES;

EID: 0032615340     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370948     Document Type: Article

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