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Volumn 363, Issue 1, 2000, Pages 42-46

Interface formation between NPB and processed indium tin oxide

Author keywords

[No Author keywords available]

Indexed keywords

AMINES; ATOMIC FORCE MICROSCOPY; ELECTRON ENERGY LEVELS; PROTONS; SEMICONDUCTING INDIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0033895925     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00979-7     Document Type: Article
Times cited : (51)

References (22)
  • 18
    • 85031590954 scopus 로고    scopus 로고
    • in press.
    • F. Nüesch, (1999) in press.
    • (1999)
    • Nüesch, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.