X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films

Chemical Physics Letters

Volumn 315, Issue 5-6, 1999, Pages 307-312

  Kim, J S ^a   Ho, P K H ^a   Thomas, D S ^a   Friend, R H ^a   Cacialli, F ^a   Bao, G W ^b   Li, S F Y ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000078978     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(99)01233-6     Document Type: Article

References (23)

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