High-resolution imaging of liquid structures: Wetting and capillary phenomena at the nanometer scale

MRS Bulletin

Volumn 22, Issue 8, 1997, Pages 36-41

  Salmeron, Miquel ^a   Xu, Lei ^a   Hu, Jun ^a   Dai, Qing ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; IMAGING TECHNIQUES; IONS; LIQUIDS; MOLECULAR ORIENTATION; NANOSTRUCTURED MATERIALS; POLARIZATION;

DIELECTRIC SPECTROSCOPY; ELECTROSTATIC FORCES; LIQUID FILMS; SCANNING POLARIZATION FORCE MICROSCOPY;

SCANNING TUNNELING MICROSCOPY;

EID: 0031209183     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/S0883769400033790     Document Type: Article

References (18)

1. G. Binning, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 50 (1983) p. 120.
2. For a review, see D.F. Ogletree and M. Salmeron, Prog. Solid-State Chem. 20 (1990) p. 2335.
3. G. Binning, C.F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56 (1986) p. 930.
4. For a review, see E. Meyer and H. Heinzelmann, in Scanning Tunneling Microscopy II, edited by R. Wiesendanger and H-J. Güntherodt (Springer-Verlag, New York, 1992) p. 99.
5. B. Marchon, P. Bernhardt, M.E. Bussell, G.A. Somorjai, M. Salmeron, and W. Siekhaus, Phys, Rev. Lett. 60 (1988) p. 1166.
6. B.J. McIntyre, M. Salmeron, and G.A. Somorjai, Rev. Sci. Instrum. 64 (3) p. 687.
7. R. Sonnenfeld and P.K. Hansma, Science 232 (1986) p. 211.
8. J. Hu, X-D. Xiao, and M. Salmeron, Appl. Phys. Lett. 67 (4) (1995) p. 476.
9. Y. Martin, D.W. Abraham, and H.K. Wickramasinghe, ibid. 52 (1988) p. 1103.
10. C.C. Williams, W.P. Hough, and S.A. Rishton, Appl. Phys. Lett. 55 (1989) p. 203.
11. H. Yokoyama and T. Inoue, Thin Solid Films 242 (1994) p. 33.
12. J. Hu, X-D. Xiao, D.F. Ogletree, and M. Salmeron, Science 268 (1995) p. 267.
13. D. Beaglehole and H.K. Christenson, J. Phys. Chem. 96 (1992) p. 3395.
14. J. Hu, X-D. Xiao, D.F. Ogletree, and M. Salmeron, Surf. Sci. 344 (1995) p. 221.
15. J. Hu, R.W. Carpick, M. Salmeron, and X-D. Xiao, J. Vac. Sci. Technol. B 14 (2) (1996) p. 1341.
16. Q. Dai, J. Hu, A. Freedman, G.N. Robinson, and M. Salmeron, J. Phys. Chem. 100 (1996) p. 9.
17. Q. Dai, A. Freedman, and G.N. Robinson, J. Electrochem. Soc. 142 (1995) p. 4063.
18. P.G. De Gennes, Rev. Mod. Phys. 57 (1985) p. 828.