Adsorption of water on solid surfaces studied by scanning force microscopy

Langmuir

Volumn 16, Issue 11, 2000, Pages 5086-5092

  Gil, A ^a   Colchero, J ^a   Luna, M ^a   Gomez Herrero J ^a   Baro A M ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC PRESSURE; ATOMIC FORCE MICROSCOPY; SURFACE PHENOMENA; THIN FILMS; WATER; WETTING;

PYROLITIC GRAPHITE; SCANNING FORCE MICROSCOPY; THIN WATER FILMS;

ADSORPTION;

EID: 0033740125     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9913304     Document Type: Article

References (21)

1. Binnig, G.; Quate, C. F.; Gerber, C. Phys. Rev. Lett. 1986, 56, 930.
2. Weisenhorn, A. L.; Hansma, P. K.; Albrecht, T. R.; Quate, C. F. Appl. Phys. Lett. 1989, 54, 2651.
3. De Pablo, P. J.; Colchero, J.; Gómez-Herrero, J.; Baró, A. M. Appl. Phys. Lett. 1998, 73, 3300.
4. Piner, R. D.; Mirkin, C. A. Langmuir 1997, 13, 6864-6868.
5. Hu, J.; Xiao, X.-D.; Salmerón, M. Appl. Phys. Lett. 1995, 67, 476.
6. Hu, J.; Xiao, X.-D.; Ogletree, D. F.; Salmerón, M. Science 1995, 267, 268.
7. Luna, M.; Rieutord, F.; Melman, N. A.; Dai, Q.; Salmerón, M. J. Phys. Chem. A 1998, 102, 6793.
8. Herminghaus, S.; Fery, A.; Reim, D. Ultramicroscopy 1997, 69, 211.
9. Pompe, T.; Fery, A.; Herminghaus, S. Langmuir 1998, 14, 2585.
10. Herminghaus, S.; Jacobs, K.; Mecke, K.; Bischof, J.; Fery, A.; Ibn-Elhaj, M.; Schlagowski, S. Science 1998, 282, 916.
11. Thundat, T.; Zheng, X.-Y.; Chen, G. Y.; Warmack, R. J. Surf. Sci. Lett. 1993, 294, L939.
12. Luna, M.; Colchero, J.; Baró, A. M. Appl. Phys. Lett. 1998, 72, 3461.
13. Giessibl, F. J. Jpn. J. Appl. Phys. 1994, 33, 3726.
14. Luna, M.; Colchero, J.; and Baró, A. M. J. Phys. Chem. B 1999, 103, 9576.
15. Aimé, J. P.; Boisgard, R.; Nony, L.; Couturier, G. Phys. Rev. Lett. 1999, 82, 3388. Nony, L.; Boisgard, R.; Aime, J. P. J. Phys. Chem. B 1999, 111, 1615.
16. Aimé, J. P.; Boisgard, R.; Nony, L.; Couturier, G. Phys. Rev. Lett. 1999, 82, 3388. Nony, L.; Boisgard, R.; Aime, J. P. J. Phys. Chem. B 1999, 111, 1615.
17. Colchero, J.; Storch, A.; Luna, Gómez-Herrero, M. J.; Baró, A. M. Langmuir 1998, 14, 2230.
18. In this context it is important to note that tip-sample distance is not varied directly. Instead the distance between the base of the cantilever and the sample is varied. The variation of the measured force versus this distance is what is represented in a force vs distance curve.
19. Odelius, M.; Bernasconi, M.; Parrinello, M. Phys. Rev. Lett. 1998, 286, 1.
20. Miranda, P. B.; Xu, L.; Shen, Y. R.; Salmeron, M. Phys. Rev. Lett. 1998, 26, 5876.
21. Thiel, P. A.; Madey, T. E. Surf. Sci. Rep. 1987, 7, 211.