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Volumn 15, Issue 3, 2002, Pages 453-464

Transparency versus efficiency: Important considerations in the design of photoacid generators for ArF lithography

Author keywords

Acid generating efficiency; C parameter; Deep UV and 193 nm chemically amplified resists; P parameter; Photoacid generator; Quantum yield

Indexed keywords

ACID; ARGON; FLUORIDE; LACTONE METHACRYLATE; METHACRYLIC ACID DERIVATIVE; METHYL 2 ADAMANTYLMETHACRYLATE; PHENOL DERIVATIVE; PHENYL GROUP; SULFONIUM DERIVATIVE; TRIPHENYLSULFONIUM ION; UNCLASSIFIED DRUG;

EID: 0036368793     PISSN: 09149244     EISSN: None     Source Type: Journal    
DOI: 10.2494/photopolymer.15.453     Document Type: Article
Times cited : (9)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.