Investigation into the use of electron back scattered diffraction to measure recrystallised fraction

Scripta Materialia

Volumn 41, Issue 2, 1999, Pages 125-129

  Black, M P ^a   Higginson, R L ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRON SCATTERING; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; OPTICAL MICROSCOPY; OPTICAL VARIABLES MEASUREMENT; RECRYSTALLIZATION (METALLURGY); STAINLESS STEEL; VOLUME FRACTION;

ELECTRON BACK SCATTERED DIFFRACTION; GRAIN SIZE MEASUREMENT;

ELECTRON DIFFRACTION;

EID: 0345533917     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(99)00051-2     Document Type: Article

References (6)

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6. Higginson R.L., Aindow M., Bate P.S. Phil. Mag. Lett. 72:1995;193.