Quantitative metallography by electron backscattered diffraction

Journal of Microscopy

Volumn 195, Issue 3, 1999, Pages 170-185

  Humphreys, F J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Diffraction; EBSD; Grain; Metallography; Quantitative; SEM; Size recrystallization; Subgrain; Texture

Indexed keywords

DATA ACQUISITION; ELECTRON DIFFRACTION; METALLOGRAPHY; MICROSTRUCTURE;

ELECTRON BACK-SCATTERED DIFFRACTION; LOCAL TEXTURE; QUANTITATIVE; QUANTITATIVE CHARACTERIZATION; QUANTITATIVE METALLOGRAPHY; RECRYSTALLISATION; SCANNING ELECTRONS; SIZE RECRYSTALLIZATION; SUBGRAINS; TEXTURE AND MICROSTRUCTURES;

SCANNING ELECTRON MICROSCOPY;

ANALYTIC METHOD; ANALYTICAL PARAMETERS; AUTOMETALLOGRAPHY; CONFERENCE PAPER; CRYSTALLIZATION; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; INFORMATION PROCESSING; PRIORITY JOURNAL;

EID: 0032854102     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00578.x     Document Type: Conference Paper

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