Determination of a Mean Orientation from a Cloud of Orientations. Application to Electron Back-Scattering Pattern Measurements

Journal of Applied Crystallography

Volumn 29 PART 6, Issue , 1996, Pages 662-666

  Humbert, Michel ^a   Gey, Nathalie ^a   Muller, Jacques ^a   Esling, Claude ^a  

^a UNIVERSITÉ DE LORRAINE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000960330     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/s0021889896006693     Document Type: Article

References (9)

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6. Humbert, M., Wagner, F. & Esling, C. (1992). J. Appl. Cryst. 25, 724-730.
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8. Humbert, M., Wagner, F., Moustahfid, H. & Esling, C. (1995). J. Appl. Cryst. 28, 571-576.
9. Schmidt, N. H., Bilde-Sorensen, J. B. & Juul Jensen, D. (1991). Scanning Microscopy, 3, 637-643.