Recent advances in the application of orientation imaging

Ultramicroscopy

Volumn 67, Issue 1-4, 1997, Pages 1-9

  Field, David P ^a  

^a TexSEM Laboratories Inc   (United States)

Author keywords

Electron back scatter diffraction; Microstructure characterization; Orientation imaging microscopy

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRON DIFFRACTION; IMAGING TECHNIQUES; SURFACE ROUGHNESS; THIN FILMS;

ELECTRON BACKSCATTER DIFFRACTION (EBSD); ORIENTATION IMAGING MICROSCOPY (OIM);

ELECTRON MICROSCOPY;

ANALYTIC METHOD; ARTICLE; AUTOMATION; CRYSTAL STRUCTURE; IMAGING SYSTEM; ORIENTATION; RADIATION SCATTERING; RELIABILITY; TECHNIQUE;

EID: 0031170838     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00104-0     Document Type: Article

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