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Materials Science and Technology

Volumn 13, Issue 1, 1997, Pages 69-78

Electron backscatter diffraction and orientation imaging microscopy

(2) Dingley, D J a,b Field, D P a

a TexSEM Laboratories Inc (United States)

b UNIVERSITY OF BRISTOL (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002519453 PISSN: 02670836 EISSN: None Source Type: Journal
DOI: 10.1179/mst.1997.13.1.69 Document Type: Article

Times cited : (102)

References (19)

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