Twinning and interfacial planes in copper

Microscopy and Microanalysis

Volumn 3, Issue 3, 1997, Pages 224-233

  Randle, Valerie ^a   Caul, Mark ^a   Fiedler, Jörn ^b  

^a SWANSEA UNIVERSITY   (United Kingdom)

^b OTTO VON GUERICKE UNIVERSITY   (Germany)

Author keywords

Asymmetric tilt boundaries; Coincidence site lattice; Electron backscatter diffraction; Grain boundary crystallography; Grain boundary plane; Twinning

Indexed keywords

EID: 0031534744     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927697970173     Document Type: Article

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