SCOPUS 정보 검색 플랫폼

Surface and Coatings Technology

Volumn 137, Issue 2-3, 2001, Pages 152-157

Field emission properties of two-layer structured SiCN films

(6) Tarntair, F G a Wu, J J b Chen, K H b Wen, C Y c Chen, L C c Cheng, H C a

a NATIONAL CHIAO TUNG UNIVERSITY (Taiwan)

b INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES (Taiwan)

c NATIONAL TAIWAN UNIVERSITY (Taiwan)

Author keywords

Electron emission; Nanocrystalline; SiCN; Two layer structure

Indexed keywords

ELECTRON EMISSION; NANOSTRUCTURED MATERIALS; RAMAN SPECTROSCOPY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

SILICON CARBON NITRIDE FILMS;

SEMICONDUCTING FILMS;

DIAMOND-LIKE CARBON;

EID: 0035868340 PISSN: 02578972 EISSN: None Source Type: Journal
DOI: 10.1016/S0257-8972(00)01072-0 Document Type: Article

Times cited : (32)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.