Temperature dependence of the direct band gap of Si-containing carbon nitride crystalline films

Physical Review B - Condensed Matter and Materials Physics

Volumn 56, Issue 11, 1997, Pages 6498-6501

  Lin, D ^a   Li, C ^a   Huang, Y ^a   Jong, Y ^b   Chen, Y ^b  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000405356     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.6498     Document Type: Article

References (16)

1. H. Xin, C. Lin, S. Zhu, S. Zou, X. Shi, H. Zhu, and P. L. F. Hemment, Nucl. Instrum. Methods Phys. Res. B 103, 309 (1995).
2. A. Y. Liu and M. L. Cohen, Science 245, 841 (1989).
3. A. Y. Liu and M. L. Cohen, Phys. Rev. B 41, 10 727 (1990).
4. A. Y. Liu and R. M. Wentzcovithch, Phys. Rev. B 50, 10 362 (1994).
5. J. Ortega and O. F. Sankey, Phys. Rev. B 51, 2624 (1995).
6. Y. Guo and W. A. Goddard III, Chem. Phys. Lett. 237, 72 (1995).
7. L. C. Chen, C. Y. Yang, D. M. Bhusari, K. H. Chen, M. C. Liu, J. C. Lin, and T. J. Chuang, Diam. Relat. Mater. 5, 514 (1996).
8. D. M. Bhusari, C. K. Chen, K. H. Chen, T. J. Chuang, L. C. Chen, and M. C. Lin, J. Mater. Res. 12, 322 (1997).
9. F. H. Pollak and H. Shen, Mater. Sci. Eng. R. Rep. R10, 275 (1993).
10. H. Mathieu, J. Allegre, and B. Gil, Phys. Rev. B 43, 2218 (1991).
11. Y. P. Varshni, Physica (Amsterdam) 34, 149 (1967).
12. K. P. O’Donnel and X. Chen, Appl. Phys. Lett. 58, 2924 (1991).
13. L. C. Chen, D. M. Bhusari, C. Y. Yang, K. H. Chen, T. J. Chuang, M. C. Lin, C. K. Chen, and Y. F. Huang (private communication).
14. Y. S. Huang, H. Qiang, F. H. Pollak, G. D. Pettit, P. D. Kirchner, J. M. Woodall, H. Stragier, and L. B. Sorensen, J. Appl. Phys. 70, 7537 (1991).
15. P. Y. Yu and M. Cardona, Fundamentals of Semiconductors (Springer, Berlin, 1996), p. 307.
16. M. L. Cohen, Phys. Scr. T1, 5 (1982).