Analysis of static and dynamic behaviour of SiC and Si devices connected in cascode configuration

Proceedings of the International Semiconductor Conference, CAS

Volumn 2, Issue , 2001, Pages 333-336

  Mihaila, A ^a   Udrea, F ^a   Azar, R ^a   Brezeanu, G ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC FIELD EFFECTS; ELECTRON MOBILITY; ENERGY GAP; FIELD EFFECT TRANSISTORS; MOSFET DEVICES; NUMERICAL ANALYSIS; VOLTAGE CONTROL;

BLOCK VOLTAGES; CASCODE CONFIGURATION;

SILICON CARBIDE;

EID: 0035744640     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)

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