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Volumn 92, Issue 1-3, 2001, Pages 1-9

CMOS-based microsensors and packaging

Author keywords

Ball bond characterization; Chemical sensor; CMOS; Infrared radiation sensor; Post processing; Thermal imager; Wire bonder calibration

Indexed keywords

BONDING; CALIBRATION; CHEMICAL SENSORS; CMOS INTEGRATED CIRCUITS; ELECTRONICS PACKAGING; INFRARED RADIATION; MICROELECTRONIC PROCESSING; MICROMACHINING; OPTIMIZATION; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0035426066     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(01)00532-5     Document Type: Article
Times cited : (62)

References (37)
  • 25
    • 0004543088 scopus 로고    scopus 로고
    • An industrial CMOS process family for integrated silicon sensors
    • Ph.D. Thesis No. 13463, BTH Zurich, Switzerland
    • (1999)
    • Müller, T.1
  • 28
    • 0004533347 scopus 로고    scopus 로고
    • Packaging of CMOS IR microsystems
    • Ph.D. Thesis No. 13646, ETH Zurich, Switzerland
    • (2000)
    • Wälti, M.1
  • 31
    • 0004478931 scopus 로고    scopus 로고
    • CMOS capacitive chemical microsystems for volatile organic compounds
    • Ph.D. Thesis No. 13460, ETH Zurich, Switzerland
    • (1999)
    • Koll, A.1
  • 37
    • 0003503829 scopus 로고    scopus 로고
    • Microelectronic bonding process monitoring by integrated sensors
    • Ph.D. Thesis No. 13685, ETH Zurich, Switzerland
    • (2000)
    • Mayer, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.