메뉴 건너뛰기




Volumn 84, Issue 1, 2000, Pages 126-133

Industrial CMOS process family adapted for the fabrication of smart silicon sensors

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ETCHING; FABRICATION; METALLIZING; MICROSCOPES; PHOTOLITHOGRAPHY; SILICON WAFERS;

EID: 0342955717     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(99)00348-9     Document Type: Article
Times cited : (49)

References (24)
  • 2
    • 0018752437 scopus 로고
    • Integrated signal conditioning for silicon pressure sensors
    • Borky J.M., Wise K.D. Integrated signal conditioning for silicon pressure sensors. IEEE Transactions on Electron Devices. ED26:1979;1906-1910.
    • (1979) IEEE Transactions on Electron Devices , vol.26 , pp. 1906-1910
    • Borky, J.M.1    Wise, K.D.2
  • 3
    • 85031573553 scopus 로고
    • MPX4100, MPX4101 Series, Manifold Absolute Pressure Sensors, Data Sheet, Motorola
    • MPX4100, MPX4101 Series, Manifold Absolute Pressure Sensors, Data Sheet, Motorola, 1995.
    • (1995)
  • 4
    • 85031568479 scopus 로고    scopus 로고
    • MD 022, Absolute Pressure Sensor, Data Sheet, Robert Bosch, Germany
    • SMD 022, Absolute Pressure Sensor, Data Sheet, Robert Bosch, Germany, 1997.
    • (1997)
  • 5
    • 85031560049 scopus 로고    scopus 로고
    • ADXL50, Monolithic Accelerometer with Signal Conditioning, Data Sheet, Analog Devices
    • ADXL50, Monolithic Accelerometer with Signal Conditioning, Data Sheet, Analog Devices, 1996.
    • (1996)
  • 8
    • 0027888160 scopus 로고
    • Piezoresistive accelerometer with overload protection and low cross-sensitivity
    • Crazzolara H., Flach G., von Münch W. Piezoresistive accelerometer with overload protection and low cross-sensitivity. Sensors and Actuators, A. 39:1993;201-207.
    • (1993) Sensors and Actuators, a , vol.39 , pp. 201-207
    • Crazzolara, H.1    Flach, G.2    Von Münch, W.3
  • 10
    • 0025497593 scopus 로고
    • Silicon pressure sensor with integrated CMOS signal-conditioning circuit and compensation of temperature coefficient
    • Kress H.-J., Bantien F., Marek J., Willmann K. Silicon pressure sensor with integrated CMOS signal-conditioning circuit and compensation of temperature coefficient. Sensors and Actuators, A. 25-27:1991;21-26.
    • (1991) Sensors and Actuators, a , vol.2527 , pp. 21-26
    • Kress, H.-J.1    Bantien, F.2    Marek, J.3    Willmann, K.4
  • 13
    • 0025417469 scopus 로고
    • Vertically structured silicon membranes by electrochemical etching
    • Huster R., Stoffel A. Vertically structured silicon membranes by electrochemical etching. Sensors and Actuators, A. 23:1990;899-903.
    • (1990) Sensors and Actuators, a , vol.23 , pp. 899-903
    • Huster, R.1    Stoffel, A.2
  • 16
    • 85031564787 scopus 로고    scopus 로고
    • CBT, 2 μm high-voltage CMOS process, Data Sheet, Austria Mikro Systeme International, Unterpremstätten, Austria
    • CBT, 2 μm high-voltage CMOS process, Data Sheet, Austria Mikro Systeme International, Unterpremstätten, Austria, 1998.
    • (1998)
  • 17
    • 85031574071 scopus 로고    scopus 로고
    • CYE, 0.8 μm CMOS process, Data Sheet, Austria Mikro Systeme International, Unterpremstätten, Austria
    • CYE, 0.8 μm CMOS process, Data Sheet, Austria Mikro Systeme International, Unterpremstätten, Austria, 1997.
    • (1997)
  • 20
    • 0032163667 scopus 로고    scopus 로고
    • The electronic nose in Lilliput
    • (special report)
    • Baltes H., Lange D., Koll A. The electronic nose in Lilliput. IEEE Spectrum. 35:1998;35-38. (special report).
    • (1998) IEEE Spectrum , vol.35 , pp. 35-38
    • Baltes, H.1    Lange, D.2    Koll, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.