On diagnosis and diagnosis test generation for pattern-dependent transition faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 20, Issue 6, 2001, Pages 791-800

  Pomeranz, Irith ^a   Reddy, Sudhakar M ^b  

^a PURDUE UNIVERSITY   (United States)

^b University of Iowa   (United States)

Author keywords

Fault diagnosis; Pattern dependent delay defects; Transition faults

Indexed keywords

ALGORITHMS; COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; DESIGN FOR TESTABILITY; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS; SEQUENTIAL CIRCUITS; SILICON;

DELAY FAULT MODEL; DIAGNOSTIC TEST GENERATION; PATTERN DEPENDENT TRANSITION FAULT;

DELAY CIRCUITS;

EID: 0035368922     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.924832     Document Type: Article

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