Diagnostic test generation procedure for synchronous sequential circuits based on test elimination

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 1074-1082

  Pomeranz, Irith ^a   Reddy, Sudhakar M ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SYNCHRONOUS SEQUENTIAL CIRCUITS;

ELECTRIC FAULT CURRENTS; ELECTRIC FAULT LOCATION; INTEGRATED CIRCUIT TESTING;

SEQUENTIAL CIRCUITS;

EID: 0032312607     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743306     Document Type: Conference Paper

References (13)