MODERN FAULT DICTIONARY.

Digest of Papers - International Test Conference

Volumn , Issue , 1985, Pages 696-702

  Richman, Jeremy ^a   Bowden, Kenneth R ^a  

^a TERADYNE INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, LSI; INTEGRATED CIRCUITS, VLSI; LOGIC CIRCUITS;

FAULT DICTIONARIES; LARGE-SCALE INTEGRATION; LOGIC CIRCUIT FAULT DIAGNOSIS; LOGIC SIMULATION; VERY LARGE-SCALE INTEGRATION;

INTEGRATED CIRCUIT TESTING;

EID: 0022320595     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)