On n-detection tests sets and variable n-detection test sets for transition faults

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 173-179

  Pomeranz, Irith ^a   Reddy, Sudhakar M ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DELAY CIRCUITS; FAILURE ANALYSIS; MATHEMATICAL MODELS; TIMING CIRCUITS;

PATH DELAY FAULTS; VARIABLE N-DETECTION TEST;

INTEGRATED CIRCUIT TESTING;

EID: 0032664182     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (17)