Two-stage fault location

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 963-968

  Ryan, Paul G ^a   Rawat, Shishpal ^a   Fuchs, W Kent ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROPROCESSOR CHIPS; VLSI CIRCUITS;

FAULT DICTIONARIES; FAULT LOCATION;

INTEGRATED CIRCUIT TESTING;

EID: 0026618706     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)