Novel approach to delay-fault diagnosis

Proceedings - Design Automation Conference

Volumn , Issue , 1992, Pages 357-360

  Girard, P ^a   Landrault, C ^a   Pravossoudovitch, S ^a  

^a UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL PATH ANALYSIS; LOGIC GATES; MANY VALUED LOGICS; SENSITIVITY ANALYSIS;

DELAY FAULT DIAGNOSIS; FAULT SIMULATION;

DIGITAL CIRCUITS;

EID: 0026994346     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)