Evaluation of a new strategy for transverse TEM specimen preparation by focused-ion-beam thinning

Materials Research Society Symposium - Proceedings

Volumn 480, Issue , 1997, Pages 173-180

  Shaapur, F ^a   Stark, T ^a   Woodward, T ^a   Graham, R J ^a  

^a NanoTEM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; IMAGE ANALYSIS; ION BEAMS; MEMBRANES; SPECIMEN PREPARATION;

FOCUSED ION BEAM (FIB) THINNING;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031341494     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-480-173     Document Type: Conference Paper

References (4)