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Volumn 385, Issue 1-2, 2001, Pages 66-73

Titanium-aluminum nitride film growth and related chemistry using dimethylamino-based precursors

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ALUMINUM NITRIDE; CARBON; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NITROGEN; PYROLYSIS; SUBSTRATES; THERMAL EFFECTS; TITANIUM; TITANIUM NITRIDE;

EID: 0035311587     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01879-4     Document Type: Article
Times cited : (10)

References (34)
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    • 0042913558 scopus 로고    scopus 로고
    • Inorganic Materials Synthesis: New Directions for Advanced Materials, Las Vegas, USA, September 7-11, 1997
    • C.H. Winter, D.M. Huffman (Eds.)
    • J.S. Custer, P.M. Smith, J.G. Fleming, E. Roherty-Osmun, in: C.H. Winter, D.M. Huffman (Eds.), Inorganic Materials Synthesis: New Directions for Advanced Materials, Las Vegas, USA, September 7-11, 1997, ACS Symposium Series 727, 1999, p. 86.
    • (1999) ACS Symposium Series , vol.727 , pp. 86
    • Custer, J.S.1    Smith, P.M.2    Fleming, J.G.3    Roherty-Osmun, E.4
  • 2
    • 0031333656 scopus 로고    scopus 로고
    • Materials Reliability in Microelectronics VII, San Francisco, USA, March 31-April 3, 1997
    • J.J. Clement, J.D. Sanchez, Jr., K.S. Krisch, Z. Suo, R.R. Keller (Eds.)
    • W.F. McArthur, F. Deng, K. Ring, P.M. Pattison, K.L. Kavanagh, in: J.J. Clement, J.D. Sanchez, Jr., K.S. Krisch, Z. Suo, R.R. Keller (Eds.), Materials Reliability in Microelectronics VII, San Francisco, USA, March 31-April 3, 1997, Materials Research Society Symposium Proceedings 473, 1997, p. 241.
    • (1997) Materials Research Society Symposium Proceedings , vol.473 , pp. 241
    • McArthur, W.F.1    Deng, F.2    Ring, K.3    Pattison, P.M.4    Kavanagh, K.L.5
  • 10
    • 0031639267 scopus 로고    scopus 로고
    • Chemical Aspects of Electronic Ceramics Processing, Boston, USA, November 30-December 4, 1997
    • P.N. Kumta, A.F. Hepp, D.N. Beach, J.J. Sullivan, B. Arkles (Eds.)
    • Y.-M. Sun, J. Endle, J.G. Ekerdt, N.M. Russell, M.D. Healy, J.M. White, in: P.N. Kumta, A.F. Hepp, D.N. Beach, J.J. Sullivan, B. Arkles (Eds.), Chemical Aspects of Electronic Ceramics Processing, Boston, USA, November 30-December 4, 1997, Materials Research Society Symposium Proceedings 495, 1998, p. 165.
    • (1998) Materials Research Society Symposium Proceedings , vol.495 , pp. 165
    • Sun, Y.-M.1    Endle, J.2    Ekerdt, J.G.3    Russell, N.M.4    Healy, M.D.5    White, J.M.6
  • 23
    • 0031618854 scopus 로고    scopus 로고
    • Chemical Aspects of Electronic Ceramics Processing, Boston, USA, November 30-December 4, 1997
    • P.N. Kumta, A.F. Hepp, D.N. Beach, J.J. Sullivan, B. Arkles (Eds.)
    • C.H. Winter, P.J. McKarns, J.T. Scheper, in: P.N. Kumta, A.F. Hepp, D.N. Beach, J.J. Sullivan, B. Arkles (Eds.), Chemical Aspects of Electronic Ceramics Processing, Boston, USA, November 30-December 4, 1997, Materials Research Society Symposium Proceedings 495, 1998, p. 95.
    • (1998) Materials Research Society Symposium Proceedings , vol.495 , pp. 95
    • Winter, C.H.1    McKarns, P.J.2    Scheper, J.T.3
  • 27
    • 85031522430 scopus 로고    scopus 로고
    • Ph.D. Dissertation, Department of Chemical Engi-neering, The University of Texas, Texas
    • J.P. Endle, Ph.D. Dissertation, Department of Chemical Engi-neering, The University of Texas, Texas, 2000.
    • (2000)
    • Endle, J.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.