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Volumn 48, Issue 3, 2001, Pages 560-566

The impact of surface states on the DC and RF characteristics of AlGaN/GaN HFETs

Author keywords

AlGaN; Current collapse; Dispersion; GaN; HEMT; HFET; Passivation; Surface states; Transistor

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC POTENTIAL; GATES (TRANSISTOR); HETEROJUNCTIONS; HIGH ELECTRON MOBILITY TRANSISTORS; PASSIVATION;

EID: 0035278804     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.906451     Document Type: Article
Times cited : (1339)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.