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Volumn 48, Issue 3, 2001, Pages 560-566
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The impact of surface states on the DC and RF characteristics of AlGaN/GaN HFETs
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Author keywords
AlGaN; Current collapse; Dispersion; GaN; HEMT; HFET; Passivation; Surface states; Transistor
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC POTENTIAL;
GATES (TRANSISTOR);
HETEROJUNCTIONS;
HIGH ELECTRON MOBILITY TRANSISTORS;
PASSIVATION;
CURRENT COLLAPSE;
SURFACE STATES;
SEMICONDUCTING ALUMINUM COMPOUNDS;
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EID: 0035278804
PISSN: 00189383
EISSN: None
Source Type: Journal
DOI: 10.1109/16.906451 Document Type: Article |
Times cited : (1339)
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References (14)
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