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Volumn 35, Issue 16, 1999, Pages 1380-1382
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Drain current compression in GaN MODFETs under large-signal modulation at microwave frequencies
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC CURRENTS;
ELECTRIC POTENTIAL;
ELECTRON TRAPS;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
MICROWAVE MEASUREMENT;
MODULATION;
MOLECULAR BEAM EPITAXY;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM COMPOUNDS;
DRAIN CURRENT;
MICROWAVE FREQUENCIES;
MOBILE ELECTRONS;
MODFETS;
FIELD EFFECT TRANSISTORS;
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EID: 0032637092
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19990957 Document Type: Article |
Times cited : (117)
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References (9)
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