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Volumn 35, Issue 12, 1999, Pages 1022-1024

Large signal frequency dispersion of AlGaN/GaN heterostructure field effect transistors

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTROMAGNETIC DISPERSION; EQUIVALENT CIRCUITS; HETEROJUNCTIONS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; TRANSCONDUCTANCE;

EID: 0032636127     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19990697     Document Type: Article
Times cited : (119)

References (6)
  • 1
    • 0031999751 scopus 로고    scopus 로고
    • High Al-content AlGaN/GaN MODEFT's for ultrahigh performance
    • WU, Y.-F., et al.: 'High Al-content AlGaN/GaN MODEFT's for ultrahigh performance', IEEE Electron Device Lett., 1998, 19, pp. 50-53
    • (1998) IEEE Electron Device Lett. , vol.19 , pp. 50-53
    • Wu, Y.-F.1
  • 2
    • 0032002237 scopus 로고    scopus 로고
    • High-Power Microwave 0.25μm gate doped-channel GaN/AlGaN Heterostructure field effect transistor
    • CHEN, Q., et al.: 'High-Power Microwave 0.25μm gate doped-channel GaN/AlGaN Heterostructure field effect transistor', IEEE Electron Device Letters, 1998, 19, pp. 44-46
    • (1998) IEEE Electron Device Letters , vol.19 , pp. 44-46
    • Chen, Q.1
  • 3
    • 0042117190 scopus 로고    scopus 로고
    • AlGaN/GaN piezoelectric HEMT's with submicron gates on sapphire
    • CHU, K.K., et al.: 'AlGaN/GaN piezoelectric HEMT's with submicron gates on sapphire', Proc. Electrochem. Soc., 1998, 12.
    • (1998) Proc. Electrochem. Soc. , vol.12
    • Chu, K.K.1
  • 4
    • 0032256580 scopus 로고    scopus 로고
    • Direct measurement of gate depletion in high breakdown (405V) AlGaN/GaN heterostrcuture field effect transistors
    • VETURY, R., et al.: 'Direct measurement of gate depletion in high breakdown (405V) AlGaN/GaN heterostrcuture field effect transistors'. IEDM 98, Tech. Dig., 1998, pp. 55-58
    • (1998) IEDM 98, Tech. Dig. , pp. 55-58
    • Vetury, R.1
  • 5
    • 0032046248 scopus 로고    scopus 로고
    • Device characteristics of scaled GaN/AlGaN MODFET's
    • NGUYEN, N.X., et al.: 'Device characteristics of scaled GaN/AlGaN MODFET's', Electron. Lett., 1998, 34, pp. 811-812
    • (1998) Electron. Lett. , vol.34 , pp. 811-812
    • Nguyen, N.X.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.