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Volumn 63, Issue 24, 2001, Pages

In situ ESR study to detect the diffusion of free H and creation of dangling bonds in hydrogenated amorphous silicon

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN; SILICON;

EID: 0034894864     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.245204     Document Type: Article
Times cited : (27)

References (54)
  • 8
    • 77956394874 scopus 로고
    • J. Stuke, W. Bernig, Taylor and Francis, London, and, in, edited by, and,) p
    • W. Beyer and J. Stuke, in Amorphous and Liquid Semiconductors, edited by J. Stuke and W. Bernig (Taylor and Francis, London, 1974) p. 245.
    • (1974) Amorphous and Liquid Semiconductors , pp. 245
    • Beyer, W.1    Stuke, J.2
  • 34
    • 0030379511 scopus 로고    scopus 로고
    • M. Hock, E. A. Schiff, S. Wagner, R. Schropp, and A. Matsuda, Materials Research Society, and, in, edited by, Pittsburgh, p
    • W. Beyer and U. Zastrow, in Amorphous Silicon Technology—1996, edited by M. Hock, E. A. Schiff, S. Wagner, R. Schropp, and A. Matsuda, MRS Symposia Proc. No. 420 (Materials Research Society, Pittsburgh, 1996), p. 497.
    • (1996) MRS Symposia Proc. , vol.420 , pp. 497
    • Beyer, W.1    Zastrow, U.2
  • 39
    • 0032591491 scopus 로고    scopus 로고
    • M. J. Sailor et al., Materials Research Society, and, in, edited by, Pittsburgh, p
    • S. Yamasaki, C. Malten, T. Umeda, J. Isoya, and K. Tanaka, in Microcrystalline and Nanocrystalline Semiconductors—1998, edited by M. J. Sailor et al., MRS Symposia No. 536 (Materials Research Society, Pittsburgh, 1999), p. 463.
    • (1999) MRS Symposia , vol.536 , pp. 463
    • Yamasaki, S.1    Malten, C.2    Umeda, T.3    Isoya, J.4    Tanaka, K.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.