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Volumn 70, Issue 9, 1997, Pages 1137-1139

In situ electron-spin-resonance measurements of film growth of hydrogenated amorphous silicon

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EID: 0000228489     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119073     Document Type: Article
Times cited : (28)

References (12)
  • 6
    • 84940885780 scopus 로고
    • edited by J. L. Vossen and W. Kern Academic, San Diego
    • See, for example, G. Lucovsky, D. V. Tsu, R. A. Rudder, and R. J. Markunas, in Thin Film Processes, edited by J. L. Vossen and W. Kern (Academic, San Diego, 1991), pp. 565-620.
    • (1991) Thin Film Processes , pp. 565-620
    • Lucovsky, G.1    Tsu, D.V.2    Rudder, R.A.3    Markunas, R.J.4
  • 8
    • 0000384363 scopus 로고
    • W. E. Jones, S. D. Macknight, and L. Teng, J. Phys. Chem. 73, 407 (1973); E. R. Ausin and F. W. Lampe, ibid. 81, 1134 (1977).
    • (1977) J. Phys. Chem. , vol.81 , pp. 1134
    • Ausin, E.R.1    Lampe, F.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.