Imaging of chemical reactivity and buckled dimers on Si(100)2×1 reconstructed surface with noncontact AFM

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 304-308

  Uchihashi, T ^a   Sugawara, Y ^a,b   Tsukamoto, T ^a   Minobe, T ^a   Orisaka, S ^a   Okada, T ^b   Morita, S ^a  

^a OSAKA UNIVERSITY   (Japan)

^b JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

Author keywords

61.16Ch; 68.35.Bs; 68.35.Dv; APN; Buckling; Chemical reactivity; Dimer; Discontinuity; Frequency shift curve; Noncontact atomic force microscopy; SF; Si(100)2 1

Indexed keywords

EID: 0000540228     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00545-5     Document Type: Article

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