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Volumn 182, Issue 1, 2000, Pages 561-566

New way to silicon microstructuring with electrochemical etching

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; ELECTROLYTES; ETCHING; MORPHOLOGY; ORGANIC COMPOUNDS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; STRESSES;

EID: 0034430824     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200011)182:1<561::AID-PSSA561>3.0.CO;2-S     Document Type: Article
Times cited : (13)

References (16)
  • 1
    • 0004248062 scopus 로고
    • Winter School, Les Houches (France) 1994, Springer-Verlag, Berlin
    • J. C. VIAL and J. DERRIEN (Eds.), Porous Science and Technology, Winter School, Les Houches (France) 1994, Springer-Verlag, Berlin 1994.
    • (1994) Porous Science and Technology
    • Vial, J.C.1    Derrien, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.