Nanometer scale electrical characterization of artificial mesostructures

Critical Reviews in Solid State and Materials Sciences

Volumn 25, Issue 1, 2000, Pages 1-28

  Durkan, C ^a   Welland, M E ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON TRANSPORT PROPERTIES; MICROMETERS;

ARTIFICIAL MESOSTRUCTURES;

NANOSTRUCTURED MATERIALS;

EID: 0033876512     PISSN: 10408436     EISSN: None     Source Type: Journal    
DOI: 10.1080/10408430091149169     Document Type: Article

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