Local transport properties of thin bismuth films studied by scanning tunneling potentiometry

Physical Review B - Condensed Matter and Materials Physics

Volumn 54, Issue 8, 1996, Pages R5283-R5286

  Briner, B ^a   Feenstra, R ^a   Chin, T ^b   Woodall, J ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000089614     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.R5283     Document Type: Article

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