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Volumn 372, Issue 3, 1996, Pages 388-398

Development of transient current and charge techniques for the measurement of effective net concentration of ionized charges (Neff) in the space charge region of p-n junction detectors

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC SPACE CHARGE; IONIZATION; SEMICONDUCTING SILICON; SEMICONDUCTOR JUNCTIONS;

EID: 0030128607     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(95)01295-8     Document Type: Article
Times cited : (167)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.