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Volumn 413, Issue 2-3, 1998, Pages 475-478
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Evidence for charge collection efficiency recovery in heavily irradiated silicon detectors operated at cryogenic temperatures
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYOGENIC EQUIPMENT;
ELECTRIC CHARGE;
ELECTRONS;
CHARGE COLLECTION EFFICIENCY;
SEMICONDUCTOR DETECTORS;
SILICON SENSORS;
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EID: 0032141751
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(98)00673-1 Document Type: Article |
Times cited : (52)
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References (15)
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