Absolute potential measurements inside microwave digital 1c's using a micromachined photoconductive sampling probe

IEEE Transactions on Microwave Theory and Techniques

Volumn 46, Issue 12 PART 2, 1998, Pages 2330-2337

  David, Gerhard ^a,b   Yun, Tae Yeoul ^a   Crites, Matthew H ^a,b   Whitaker, John F ^a,b   Weatherford, Todd R ^a,b   Kay Jobe, Scott ^a,b   Meyer, ^a,b   Bustamante, Mario J ^a,b  

^a University of Michigan   (United States)

^b Naval Postgraduate School   (United States)

Author keywords

Integrated circuit testing; Microwave measurements; Nondestructive testing; Photoconductive measurements; Time domain measurements; Voltage measurement

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; ELECTRIC CURRENT MEASUREMENT; FREQUENCY DIVIDING CIRCUITS; HETEROJUNCTION BIPOLAR TRANSISTORS; INTEGRATED CIRCUIT TESTING; MICROMACHINING; MICROWAVE MEASUREMENT; NONDESTRUCTIVE EXAMINATION; PHOTOCONDUCTING DEVICES; PROBES; SEMICONDUCTING INDIUM PHOSPHIDE; VOLTAGE MEASUREMENT;

MICROMACHINED PHOTOCONDUCTIVE SAMPLING PROBES;

MICROWAVE INTEGRATED CIRCUITS;

EID: 0032289738     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.739220     Document Type: Article

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