Ultrafast - Ultrafine probing of high-speed electrical waveforms using a scanning force microscope with photoconductive gating

Optical and Quantum Electronics

Volumn 28, Issue 7, 1996, Pages 843-865

  Nees, J ^a   Wakana, S I ^b   Hama, S ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL CIRCUITS; ELECTRIC VARIABLES MEASUREMENT; ELECTRIC WAVEFORMS; EQUIPMENT TESTING; FABRICATION; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; PHOTOCONDUCTIVITY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR LASERS; WAVEFORM ANALYSIS;

ANALOGUE CIRCUITS; FUNCTIONALITY; HIGH SPEED ELECTRICAL WAVEFORMS; IN SITU IMAGING; MICROVOLTS SENSITIVITY; PHOTOCONDUCTIVE GATING; SCANNING FORCE MICROSCOPE PROBES; SEMICONDUCTOR LASER SOURCES; TIME RESOLVED WAVEFORM ANALYSIS; WAVEFORM MEASUREMENT;

PROBES;

EID: 0030192951     PISSN: 03068919     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00820152     Document Type: Article

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