Picosecond Optoelectronic Measurement of S Parameters and Optical Response of an AIGaAs/GaAs HBT

IEEE Transactions on Microwave Theory and Techniques

Volumn 38, Issue 5, 1990, Pages 683-686

  Moss, S ^c   Smith, D ^c   Camou, J ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b NORTHROP GRUMMAN CORPORATION   (United States)

^c AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE MEASUREMENTS; OPTOELECTRONIC DEVICES;

MILLIMETER-WAVE TRANSISTORS; PICOSECOND OPTOELECTRONIC SYSTEM; S PARAMETERS MEASUREMENT; VECTOR NETWORK ANALYZER;

TRANSISTORS, BIPOLAR;

EID: 0025430523     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.54944     Document Type: Article

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