Picosecond-response photoconductive-sampling probe for digital circuit testing

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Volumn 2, Issue , 1997, Pages 236-237

  David, G ^a   Whitaker, J F ^a   Ledbetter, E J ^a   Weatherford, T R ^a   Fouts, D ^a   Goyette, W ^a   Jobe, K ^a   Elliott, K ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; ELECTRIC NETWORK ANALYSIS; ELECTRIC VARIABLES MEASUREMENT; HETEROJUNCTION BIPOLAR TRANSISTORS; PHOTOCONDUCTING DEVICES; PROBES; WAVEFORM ANALYSIS;

PICOSECOND RESPONSE PHOTOCONDUCTIVE SAMPLING PROBES; SINGLE EVENT UPSETS (SEU);

INTEGRATED CIRCUIT TESTING;

EID: 0031386089     PISSN: 10928081     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)