DC-to-mm-wave absolute potential measurements inside digital microwave ICs using a micromachined photoconductive sampling probe

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1998, Pages 1333-1336

  David, G ^a   Whitaker, J F ^a   Weatherford, T R ^a   Jobe, K ^a   Meyer, S ^a   Bustamante, M ^a   Goyette, W ^a   Thomas III, S ^a   Elliot, K ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DELAY CIRCUITS; DIGITAL INTEGRATED CIRCUITS; ELECTRIC NETWORK ANALYSIS; FREQUENCY DIVIDING CIRCUITS; HETEROJUNCTION BIPOLAR TRANSISTORS; PHOTOCONDUCTING DEVICES; PROBES; VOLTAGE MEASUREMENT;

MICROMACHINED PHOTOCONDUCTING SAMPLING PROBES;

MICROWAVE INTEGRATED CIRCUITS;

EID: 0031640271     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)