Photoconductive sampling with an integrated source follower/amplifier

Applied Physics Letters

Volumn 68, Issue 11, 1996, Pages 1464-1466

  Hwang, Jiunn Ren ^a   Cheng, Heng Ju ^a   Whitaker, John F ^a   Rudd, James V ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b Picometrix Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CAPACITANCE; ELECTRIC CURRENT MEASUREMENT; ELECTRIC IMPEDANCE; FIELD EFFECT TRANSISTORS; GATES (TRANSISTOR); OPTICAL PUMPING; OPTICAL SWITCHES; SIGNAL TO NOISE RATIO; VOLTAGE MEASUREMENT;

JUNCTION FIELD EFFECT TRANSISTORS; OPTICAL GATING; PHOTOCONDUCTIVE PHOTOGATE; PICOSECOND RESPONSE; SOURCE FOLLOWER AMPLIFIERS;

INTEGRATED OPTOELECTRONICS;

EID: 0030106298     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116255     Document Type: Article

References (5)

1. Y. Chen, S. Williamson, and T. Brock, Appl. Phys. Lett. 64, 551 (1994).
2. J. Kim, S. Williamson, J. Nees, S. Wakana, and J. Whitaker, Appl. Phys. Lett. 62, 2268 (1993).
3. T. Preifer, H.-M. Heiliger, E. Stein von Kamienski, H. G. Roskos, and H. Kurz, J. Opt. Soc. Am. B 11, 2547 (1994).
4. S. Weiss, D. F. Ogletree, D. Botkin, M. Salmeron, and D. S. Chemla, Appl. Phys. Lett. 63, 2567 (1993).
5. E. Oxner, Designing with Field-Effect Transistors, 2nd ed. (McGraw-Hill, New York, 1990).