Picosecond Optoelectronic Measurement of the High-Frequency Scattering Parameters of a GaAs FET

IEEE Journal of Quantum Electronics

Volumn 22, Issue 1, 1986, Pages 94-100

  Cooper, Donald E ^a   Moss, Steven C ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL TRANSFORMATIONS - FOURIER TRANSFORMS; PHOTOCONDUCTING DEVICES; SEMICONDUCTING GALLIUM ARSENIDE; TRANSISTORS, FIELD EFFECT;

ULTRAFAST TRANSIENTS;

OPTOELECTRONIC DEVICES;

EID: 0022593945     PISSN: 00189197     EISSN: 15581713     Source Type: Journal    
DOI: 10.1109/JQE.1986.1072878     Document Type: Article

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