Subpicosecond Electrooptic Sampling: Principles and Applications

IEEE Journal of Quantum Electronics

Volumn 22, Issue 1, 1986, Pages 69-78

  Valdmanis, Janis A ^a   Mourou, G ^b  

^a LUCENT TECHNOLOGIES   (United States)

^b UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT TESTING - TRANSIENTS; INTEGRATED CIRCUITS; TRANSISTORS, FIELD EFFECT;

PICOSECOND ELECTRONIC DEVICES;

ELECTROOPTICAL EFFECTS;

EID: 0022581802     PISSN: 00189197     EISSN: 15581713     Source Type: Journal    
DOI: 10.1109/JQE.1986.1072867     Document Type: Article

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