Limitations on ULSI-FeRAMs

IEICE Transactions on Electronics

Volumn E81-C, Issue 4, 1998, Pages 477-487

  Scott, James F ^a,b  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

Ferroelectrics; Memories; Non volatile; RAM

Indexed keywords

ELECTRIC BREAKDOWN OF SOLIDS; FERROELECTRIC DEVICES; GATES (TRANSISTOR); NONVOLATILE STORAGE; THIN FILM DEVICES; ULSI CIRCUITS;

DEPOLARIZATION FIELD INSTABILITY;

RANDOM ACCESS STORAGE;

EID: 0032046675     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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