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Volumn 135, Issue 1, 1992, Pages 163-168

Thickness dependence of D.C. leakage current in lead zirconate-titanate (Pzt) memories

Author keywords

[No Author keywords available]

Indexed keywords


EID: 84963444247     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150199208230022     Document Type: Article
Times cited : (43)

References (11)
  • 3
    • 84963389301 scopus 로고
    • Sandia Laboratories report SC-RR-67-730, (unpublished)
    • R. Plumlee, Sandia Laboratories report SC-RR-67-730 (1967) (unpublished).
    • (1967)
    • Plumlee, R.1
  • 8
    • 84963272716 scopus 로고
    • (Monterey, March 11, in press in Ferroelectrics
    • W. Larson et al., ISIF '92 (Monterey, March 11, 1992), in press in Ferroelectrics.
    • (1992) ISIF '92
    • Larson, W.1
  • 9
  • 10
    • 0004985361 scopus 로고
    • (Monterey, CA, March 11, Ferroelectrics, in press)
    • K. Takenaka, W. Larson et al., Proc. ISIF '92 (Monterey, CA, March 11, 1992; Ferroelectrics, in press).
    • (1992) Proc. ISIF '92
    • Takenaka, K.1    Larson, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.