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Volumn 35, Issue 2 SUPPL. B, 1996, Pages 1564-1568

Memory retention and switching speed of ferroelectric field effect in (Pb, La)(Ti, Zr)O3/La2CuO4:Sr heterostructure

Author keywords

Ferroelectric; FET; Field effect; Nonvolatile memory; Oxide superconductor; Perovskite; Semiconductor

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; FERROELECTRIC MATERIALS; FERROELECTRICITY; FIELD EFFECT TRANSISTORS; INTEGRATED CIRCUITS; NONVOLATILE STORAGE; OXIDE SUPERCONDUCTORS; PEROVSKITE; SWITCHING;

EID: 0030078786     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.1564     Document Type: Article
Times cited : (34)

References (21)
  • 17
    • 4243133936 scopus 로고    scopus 로고
    • note
    • -3 mol%). In a MOSFET, current flows only through the highly conductive channel, because of the existence of the pn junction and the difference in conductivity of several orders of magnitude between the inversion region and the remaining bulk region. In the present device, the conductivity of the enhanced region should be only one order of magnitude higher than that of the region unaffected by the ferroelectric surface charge.
  • 18
    • 4243147452 scopus 로고    scopus 로고
    • note
    • seμ. Hence, we obtain the last expression.
  • 19
    • 85087251175 scopus 로고    scopus 로고
    • note
    • gate/R ∼ 1/2, if the contact resistance at source/drain electrodes is negligibly small.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.