A model of voltage-dependent dielectric losses for ferroelectric MMIC devices

Integrated Ferroelectrics

Volumn 6, Issue 1-4, 1995, Pages 189-203

  De Araujo, Carlos A Paz ^d   Mcmillan, L D ^d  

^a RMIT UNIVERSITY   (Australia)

^b UNIVERSITY OF COLORADO   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d Symetrix Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 7044245605     PISSN: 10584587     EISSN: 16078489     Source Type: Journal    
DOI: 10.1080/10584589508019364     Document Type: Article

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